To request reprints, please contact Mark Hersam: m-hersam@northwestern.edu
Publications (*indicates invited paper, #indicates cover article):
*[84] M. C. Hersam, “Tuning the electrical and optical properties of monodisperse carbon-based nanomaterials,” Electrochem. Soc., 801, 974 (2008).
[83] A. A. Green and M. C. Hersam, “Colored semitransparent conductive coatings consisting of monodisperse metallic single-walled carbon nanotubes,” Nano Lett., 8, 1417 (2008).
[82] H. Qian, C. Georgi, N. Anderson, A. A. Green, M. C. Hersam, L. Novotny, and A. Hartschuh, “Exciton energy transfer in pairs of single-walled carbon nanotubes,” Nano Lett., 8, 1363 (2008).
[81] G. H. Chan, M.-L. Liu, L.-D. Chen, F.-Q. Huang, D. E. Bugaris, D. M. Wells, J. R. Ireland, M. C. Hersam, R. P. Van Duyne, and J. A. Ibers, “Syntheses, crystal structures, and physical properties of La5Cu6O4S7 and La5Cu6.33O4S7,” Inorg. Chem., 47, 4368 (2008).
[80] T. Gokus, A. Hartschuh, H. Harutyunyan, M. Allegrini, F. Hennrich, M. Kappes, A. A. Green, M. C. Hersam, P. T. Araujo, and A. Jorio, “Exciton decay dynamics in individual carbon nanotubes at room temperature,” Appl. Phys. Lett., 92, 153116 (2008).
[79] N. P. Guisinger, N. L. Yoder, S. P. Elder, and M. C. Hersam, “Subnanometer imaging of adsorbate-induced electronic structure perturbation on silicon surfaces,” J. Phys. Chem. C, 112, 2116 (2008).
[78] B. J. Leever, M. F. Durstock, M. D. Irwin, A. W. Hains, T. J. Marks, L. S. C. Pingree, and M. C. Hersam, “Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy,” Appl. Phys. Lett., 92, 013302 (2008).
[77] S. Jin, Y. Yang, J. E. Medvedeva, L. Wang, S. Li, N. Cortes, J. R. Ireland, A. W. Metz, J. Ni, M. C. Hersam, A. J. Freeman, and T. J. Marks, “Tuning the properties of transparent oxide conductors. Dopant ion size and electronic structure effects on CdO-based transparent conducting oxides. Ga- and In doped CdO thin films grown by MOCVD,” Chem. Mater., 20, 220 (2008).
[76] M. J. Schmitz, C. R. Kinser, N. E. Cortes, and M. C. Hersam, “Ambient atomic force microscope nanoscale oxidation of hydrogen-passivated silicon with conductive diamond coated probes,” Small, 3, 2053 (2007).
*[75] A. A. Green and M. C. Hersam, “Ultracentrifugation of single-walled carbon nanotubes,” Materials Today, 10, 59 (2007).
[74] L. S. C. Pingree, M. T. Russell, B. J. Scott, T. J. Marks, and M. C. Hersam, “Probing individual nanoscale organic light-emitting diodes with atomic force electroluminescence microscopy and bridge-enhanced nanoscale impedance microscopy,” Organic Electronics, 8, 465 (2007).
[73] L. S. C. Pingree, M. J. Schmitz, D. E. Kramer, and M. C. Hersam, “Laser assisted field induced oxide nanopatterning of hydrogen passivated silicon surfaces,” Appl. Phys. Lett., 91, 073110 (2007).
[72] J. W. Elam, A. V. Zinovev, M. J. Pellin, D. J. Comstock, and M. C. Hersam, “Nucleation and growth of noble metals on oxide surfaces using atomic layer deposition,” ECS Trans., 3, 271 (2007).
*[71] M. C. Hersam, “Isolating monodisperse single-walled carbon nanotubes via density gradient ultracentrifugation,” Electrochem. Soc., 701, 1042 (2007).
*[70] T. Hertel, Z. Zhu, J. Crochet, M. S. Arnold, M. C. Hersam, and D. Resasco, “Exciton dynamics in carbon nanotubes,” Electrochem. Soc., 701, 1041 (2007).
[69] S. Schneider, J. R. Ireland, M. C. Hersam, and T. J. Marks, “Copper(I) tert-butylthiolato clusters as single-source precursors for high-quality chalcocite thin films: Film growth and microstructure control,” Chem. Mater., 19, 2780 (2007).
[68] Z. Zhu, J. Crochet, M. S. Arnold, M. C. Hersam, H. Ulbricht, D. Resasco, and T. Hertel, “Pump-probe spectroscopy of exciton dynamics in (6,5) carbon nanotubes,” J. Phys. Chem. C, 111, 3831 (2007).
[67] L. S. C. Pingree, M. T. Russell, T. J. Marks, and M. C. Hersam, “Monitoring interface traps in operating organic light-emitting diodes using impedance spectroscopy,” Thin Solid Films, 515, 4783 (2007).
[66] R. Basu, J.-C. Lin, C.-Y. Kim, M. J. Schmitz, N. L. Yoder, J. A. Kellar, M. J. Bedzyk, and M. C. Hersam, “Structural characterization of 4-bromostyrene self-assembled monolayers on Si(111),” Langmuir, 23, 1905 (2007).
#,*[65] N. P. Guisinger, S. P. Elder, N. L. Yoder, and M. C. Hersam, “Ultra-high vacuum scanning tunneling microscopy investigation of free radical adsorption to the Si(111)-7x7 surface,” Nanotechnology, 18, 044011 (2007).
*[64] E. T. Foley and M. C. Hersam, “Assessing the need for nanotechnology education reform in the
[63] N. L. Yoder, N. P. Guisinger, M. C. Hersam, R. Jorn, C.-C. Kaun, and T. Seideman, “Quantifying desorption of saturated hydrocarbons from silicon with quantum calculations and scanning tunneling microscopy,” Phys. Rev. Lett., 97, 187601 (2006).
[62] M.
*[61] M. S. Arnold, S. I. Stupp, and M. C. Hersam, “Optimizing the purification of biofunctionalized carbon nanotubes,” Proceedings of the 2006 ASME International Conference on Manufacturing Science and Engineering, 1, 21046 (2006).
[60] G. H. Chan, B. Deng, M. Bertoni, J. R. Ireland, M. C. Hersam, T. O. Mason, R. P. Van Duyne, and J. A. Ibers, “Syntheses, structures, physical properties, and theoretical studies of CeMxOS (M = Cu, Ag; x ~ 0.8) and CeAgOS,” Inorg. Chem., 45, 8264 (2006).
[59] L. S. C. Pingree, M. T. Russell, T. J. Marks, and M. C. Hersam, “Negative capacitance in organic light-emitting diodes: Implications for display applications,” Proceedings of the 64th Device Research Conference (IEEE,
*[58] M. C. Hersam, “Monitoring and analyzing nonlinear dynamics in atomic force microscopy,” Small, 2, 1122 (2006).
[57] L. S. C. Pingree, M. T. Russell, T. J. Marks, and M. C. Hersam, “Field dependent negative capacitance in small-molecule organic light-emitting diodes,” J. Appl. Phys., 100, 044502 (2006).
#[56] M. T. Russell, L. S. C. Pingree, M. C. Hersam, and T. J. Marks, “Micro-scale features and surface chemical functionality patterned by electron beam lithography. A novel route to poly(dimethylsiloxane) (PDMS) stamp fabrication,” Langmuir, 22, 6712 (2006).
*[55] R. Basu, C. R. Kinser, J. D. Tovar, and M. C. Hersam, “Bromine functionalized molecular adlayers on hydrogen passivated silicon surfaces,” Chem. Phys., 326, 144 (2006).
[54] C.-Y. Kim, J. W. Elam, M. J. Pellin, D. Goswami, S. T. Christensen, M. C. Hersam, P. C. Stair, and M. J. Bedzyk, “X-ray standing wave imaging of atomic layer deposited (ALD) tungsten monolayers on α-TiO2(110),” J. Phys. Chem. B, 110, 12616 (2006).
[53] C. R. Kinser, M. J. Schmitz, and M. C. Hersam, “Kinetics and mechanism of atomic force microscope field induced oxidation on hydrogen-passivated silicon in inert organic solvents,” Adv. Mater., 18, 1377 (2006).
*[52] N. L. Yoder and M. C. Hersam, “Probing the performance and reliability of silicon-based molecular electronic devices with ultra-high vacuum scanning tunneling microscopy,” Proceedings of the 3rd Annual Foundations of Nanoscience Conference, 1, 80 (2006).
[51] L. S. C. Pingree and M. C. Hersam, “Bridge enhanced nanoscale impedance microscopy,” Appl. Phys. Lett., 87, 233117 (2005).
[50] T. Rakshit, G.-C. Liang, A.W. Ghosh, M. C. Hersam, and
[49] R. Basu, J. D. Tovar, and M. C. Hersam, “Scanning tunneling microscopy study of single molecule motion on the Si(100)-2×1 surface,” J. Vac. Sci. Technol. B, 23, 1785 (2005).
[48] M. E. Greene, A. N. Chiaramonti, S. T. Christensen, L. X. Cao, M. J. Bedzyk, and M. C. Hersam, “Controlled nanoscale morphology of hematite (0001) surfaces grown by chemical vapor transport,” Adv. Mater., 17, 1765 (2005).
#,*[47] N. P. Guisinger, N. L. Yoder, and M. C. Hersam, “Probing charge transport at the single molecule level on silicon by using cryogenic ultra-high vacuum scanning tunneling microscopy,” Proc. Nat. Acad. Sci. USA, 102, 8838 (2005).
[46] T. J. Marks, Y. Yang, S. Jin, J. E. Medvedeva, J. R. Ireland, A. W. Metz, J. Ni, M. C. Hersam, and A. J. Freeman, “CdO as the archetypical transparent conducting oxide. Systematics of dopant ionic radius and electronic structure effects on charge transport and band structure,” J. Am. Chem. Soc., 127, 8796 (2005).
[45] M. S. Arnold, M. O. Guler, M. C. Hersam, and S. I. Stupp, “Encapsulation of carbon nanotubes by self-assembling peptide amphiphiles,” Langmuir, 21, 4705 (2005).
[44] M. S. Arnold, S. I. Stupp, and M. C. Hersam, “Enrichment of single-walled carbon nanotubes by diameter in density gradients,” Nano Lett., 5, 713 (2005).
[43] L. S. C. Pingree, E. F. Martin, K. R. Shull, and M. C. Hersam, “Nanoscale impedance microscopy: A characterization tool for nanoelectronic devices and circuits,” IEEE T. Nanotechnol., 4, 255 (2005).
#[42] J. C. Stendahl, E. R. Zubarev, M. S. Arnold, M. C. Hersam, H.-J. Sue, and S. I. Stupp, “Structural modifications to polystyrene via self-assembling molecules,” Adv. Funct. Mater., 15, 487 (2005).
[41] L. S. C. Pingree, B. J. Scott, M. T. Russell, T. J. Marks, and M. C. Hersam, “Negative capacitance in organic light emitting diodes,” Appl. Phys. Lett., 86, 073509 (2005).
[40] C. R. Kinser, M. J. Schmitz, and M. C. Hersam, “Conductive atomic force microscope nanopatterning of hydrogen passivated silicon in inert organic solvents,” Nano Lett., 5, 91 (2005).
[39] K. R. Shull, E. F. Martin, P. L. Drzal, M. C. Hersam, A. Markowitz, and R. McSwain, “Adhesive transfer of thin viscoelastic films,” Langmuir, 21, 178 (2005).
[38] A. S. Baluch, N. P. Guisinger, and M. C. Hersam, “Negative differential resistance through individual organic molecules bound to the Si(111)-7×7 surface,” TMS Lett., 1, 125 (2004).
[37] L. S. C. Pingree, M. M. Kern, B. J. Scott, T. J. Marks, and M. C. Hersam, “Quantum efficiency of micron scaled organic light emitting diodes using atomic force electroluminescence microscopy,” TMS Lett., 1, 127 (2004).
[36] E. T. Foley, N. L. Yoder, N. P. Guisinger, and M. C. Hersam, “Cryogenic variable temperature ultra-high vacuum scanning tunneling microscope for single molecule studies on silicon surfaces,” Rev. Sci. Instrum., 75, 5280 (2004).
*[35] M. E. Greene, C. R. Kinser, D. E. Kramer, L. S. C. Pingree, and M. C. Hersam, “Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials,” Microscopy Research and Technique, 64, 415 (2004).
*[34] N. P. Guisinger, R. Basu, M. E. Greene, A. S. Baluch, and M. C. Hersam, “Characterization of silicon-based molecular resonant tunneling diodes with scanning tunneling microscopy,” Proceedings of the 62nd Device Research Conference (IEEE,
#[33] R. Basu, N. P. Guisinger, M. E. Greene, and M. C. Hersam, “Room temperature nanofabrication of atomically registered heteromolecular organosilicon nanostructures using multi-step feedback controlled lithography,” Appl. Phys. Lett., 85, 2619 (2004).
[32] L. S. C. Pingree, M. C. Hersam, M. M. Kern, B. J. Scott, and T. J. Marks, “Spatially resolved electroluminescence of operating organic light-emitting diodes using conductive atomic force microscopy,” Appl. Phys. Lett., 85, 344 (2004).
[31] H. Jin, C. R. Kinser, P. A. Bertin, D. E. Kramer, J. A. Libera, M. C. Hersam, S. T. Nguyen, and M. J. Bedzyk, “X-ray studies of self-assembled monolayers grown on hydrogen-terminated Si(111),” Langmuir, 20, 6252 (2004).
*[30] M. C. Hersam and R. Reifenberger, “Charge transport through molecular junctions,” MRS Bull., 29, 385 (2004).
*[29] M. S. Arnold, S. Lan, S. C. Cruz, J. E. Sharping, S. I. Stupp, P. Kumar, and M. C. Hersam, “Optical absorption and transient photobleaching in solutions of surfactant encapsulated and DNA wrapped single-walled carbon nanotubes,” Proc. of SPIE, 5359, 376 (2004).
#,*[28] N. P. Guisinger, R. Basu, M. E. Greene, A. S. Baluch, and M. C. Hersam, “Observed suppression of room temperature negative differential resistance in organic monolayers on Si(100),” Nanotechnology, 15, S452 (2004).
[27] M. E. Greene, N. P. Guisinger, R. Basu, A. S. Baluch, and M. C. Hersam, “Nitroxyl free radical binding to Si(100): A combined STM and computational modeling study,” Surf. Sci., 559, 16 (2004).
[26] A. S. Baluch, N. P. Guisinger, R. Basu, E. T. Foley, and M. C. Hersam, “Atomic-level robustness of the Si(100)-2x1:H surface following liquid phase chemical treatments in atmospheric pressure environments,” J. Vac. Sci. Technol. A, 22, L1 (2004).
[25] M. W. Such, D. E. Kramer, and M. C. Hersam, “Reproducible lateral force microscopy measurements for quantitative comparisons of the frictional and chemical properties of nanostructures,” Ultramicroscopy, 99, 189 (2004).
[24] M. C. Hersam, M. Luna, and G. Light, “Implementation of interdisciplinary group learning and peer assessment in a nanotechnology engineering course,” Journal of Engineering Education, 93, 49 (2004).
#[23] N. P. Guisinger, M. E. Greene, R. Basu, A. S. Baluch, and M. C. Hersam, “Room temperature negative differential resistance through individual molecules on silicon surfaces,” Nano Lett., 4, 55 (2004).
[22] B. Wang, X. Zheng, J. Michl, E. T. Foley, M. C. Hersam, A. Bilić, M. J. Crossley, J. R. Reimers, and N. S. Hush, “An azanorbornadiene anchor for molecular-level construction on silicon(100),” Nanotechnology, 15, 324 (2004).
[21] N. P. Guisinger, R. Basu, A. S. Baluch, and M. C. Hersam, “Molecular electronics on silicon: An ultra-high vacuum scanning tunneling microscopy study,” Ann. N. Y. Acad. Sci., 1006, 227 (2003).
[20] M. S. Arnold, J. E. Sharping, S. I. Stupp, P. Kumar, and M. C. Hersam, “Band gap photobleaching in isolated single-walled carbon nanotubes,” Nano Lett., 3, 1549 (2003).
*[19] M. C. Hersam and Y. W. Chung, “Detecting elusive surface atoms with atomic force microscopy,” Proc. Natl. Acad. Sci. USA, 100, 12531 (2003).
*[18] M. S. Arnold, S. I. Stupp, and M. C. Hersam, “Tuning the optical properties of carbon nanotube solutions using amphiphilic self-assembly,” Proc. of SPIE, 4999, 238 (2003).
*[17] A. S. Baluch, R. Basu, N. P. Guisinger, C. R. Kinser, D. E. Kramer, M. W. Such, and M. C. Hersam, “Nanoscale control of friction and chemistry on silicon surfaces,” Mat. Res. Soc. Symp. Proc., 750, Y9.1.1 (2003).
[16] Y. Koide, M. W. Such, R. Basu, G. Evmenenko, J. Cui, P. Dutta, M. C. Hersam, and T. J. Marks, “Hot microcontact printing for patterning ITO surfaces. Methodology, morphology, microstructure, and OLED charge injection barrier imaging,” Langmuir, 19, 86 (2003).
*[15] M. C. Hersam, “Single molecule sensing, characterization, and actuation,” Proceedings of the 6th World Multiconference on Systemics, Cybernetics, and Informatics, 17, 338 (2002).
[14] M. C. Hersam, N. P. Guisinger, J. Lee, K. Cheng, and J. W. Lyding, “Variable temperature study of the passivation of dangling bonds at Si(100)-2×1 reconstructed surfaces with H and D,” Appl. Phys. Lett., 80, 201 (2002).
[13] E. F. Fabbroni, K. R. Shull, and M. C. Hersam, “Adhesive and mechanical properties of soft nanocomposites: Model studies with blended latex films,” J. Polym. Sci. Polym. Phys., 39, 3090 (2001).
[12] P. G. Collins, M. C. Hersam, M. Arnold, R. Martel, and Ph. Avouris, “Current saturation and electrical breakdown in multiwalled carbon nanotubes,” Phys. Rev. Lett., 86, 3128 (2001).
[11] M. C. Hersam, N. P. Guisinger, J. W. Lyding, D. S. Thompson, and J. S. Moore, “Atomic-level study of the robustness of the Si(100)-2x1:H surface following exposure to ambient conditions,” Appl. Phys. Lett., 78, 886 (2001).
*[10] M. C. Hersam, N. P. Guisinger, and J. W. Lyding, “Assessing the impact of fundamental scanning tunneling microscopy studies on VLSI technology,” Proceedings of the 9th NASA Symposium on VLSI Design, 1, 5.1.1 (2000).
[9] M. C. Hersam, J. Lee, N. P. Guisinger, and J. W. Lyding, “Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics,” Superlattices and Microstructures, 27, 583 (2000).
[8] M. C. Hersam, N. P. Guisinger, and J. W. Lyding, “Silicon-based molecular nanotechnology,” Nanotechnology, 11, 70 (2000).
[7] M. C. Hersam, N. P. Guisinger, and J. W. Lyding, “Isolating, imaging, and electrically characterizing individual organic molecules on the Si(100) surface with the scanning tunneling microscope,” J. Vac. Sci. Technol. A, 18, 1349 (2000).
[6] Phaedon Avouris, Richard Martel, Hiroya Ikeda, Mark Hersam, Herbert R. Shea, and Alain Rochefort, “Electrical properties of carbon nanotubes: spectroscopy, localization, and electrical breakdown,” Science and Application of Nanotubes, editors: David Tománek and Richard Enbody, Kluwer Academic Publishers, 2000, p. 223 (ISBN: 0-306-46372-5).
[5] M. C. Hersam, G. C. Abeln, and J. W. Lyding, “An approach for efficiently locating and electrically contacting nanostructures fabricated via UHV-STM lithography on Si(100),” Microelectronic Engineering, 47, 235 (1999).
[4] G. C. Abeln, M. C. Hersam, D. S. Thompson, S.-T. Hwang, H. Choi, J. S. Moore, and J. W. Lyding, “Approaches to nanofabrication on Si(100) surfaces: Selective area chemical vapor deposition of metals and selective chemisorption of organic molecules,” J. Vac. Sci. Technol. B, 16, 3874 (1998).
[3] J. W. Lyding, K. Hess, G. C. Abeln, D. S. Thompson, J. S. Moore, M. C. Hersam, E. T. Foley, J. Lee, Z. Chen, S.-T. Hwang, H. Choi, Ph. Avouris, and I. C. Kiziyalli, “UHV STM nanofabrication and hydrogen/deuterium desorption from silicon surfaces: implications for CMOS technology,” Appl. Surf. Sci., 132, 221 (1998).
[2] M. C. Hersam, A. C. F. Hoole, S. J. O'Shea, and M. E. Welland, “Potentiometry and repair of electrically stressed nanowires using atomic force microscopy,” Appl. Phys. Lett., 72, 915 (1998).
[1] S. Ahuja, M. C. Hersam, C. Ross, H. T. Chien, and A. C. Raptis, “A micromachined surface acoustic wave sensor for detecting inert gases,” Proceedings of the 1996 IEEE Ultrasonics Symposium, 1, 435 (1996).